• DocumentCode
    1118374
  • Title

    Analysis of Logic Circuits with Faults Using Input Signal Probabilities

  • Author

    Parker, Kenneth P. ; McCluskey, Edward J.

  • Author_Institution
    Digital Systems Laboratory, Stanford University
  • Issue
    5
  • fYear
    1975
  • fDate
    5/1/1975 12:00:00 AM
  • Firstpage
    573
  • Lastpage
    578
  • Abstract
    A probabilistic treatment of general combinational networks has been developed. Using the notions of the probability of a signal and signal independence, algorithms have been presented to calculate the probability of the output of a logic circuit being 1. Simplifications to the algorithm result when sets of input probabilities are given the same value, and this process called bundling is described in the paper. Finally, a series of examples illustrate the application of the probabilistic approach to the analysis of faulty logic circuits.
  • Keywords
    Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.; Boolean functions; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Logic circuits; Probabilistic logic; Probability; Signal analysis; Signal processing; Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224264
  • Filename
    1672857