DocumentCode
1118374
Title
Analysis of Logic Circuits with Faults Using Input Signal Probabilities
Author
Parker, Kenneth P. ; McCluskey, Edward J.
Author_Institution
Digital Systems Laboratory, Stanford University
Issue
5
fYear
1975
fDate
5/1/1975 12:00:00 AM
Firstpage
573
Lastpage
578
Abstract
A probabilistic treatment of general combinational networks has been developed. Using the notions of the probability of a signal and signal independence, algorithms have been presented to calculate the probability of the output of a logic circuit being 1. Simplifications to the algorithm result when sets of input probabilities are given the same value, and this process called bundling is described in the paper. Finally, a series of examples illustrate the application of the probabilistic approach to the analysis of faulty logic circuits.
Keywords
Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.; Boolean functions; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Logic circuits; Probabilistic logic; Probability; Signal analysis; Signal processing; Boolean difference, fault detection, general combinational networks, input probability, iterative cells, output probability, probability, signal reliability, symmetric functions, test generation.;
fLanguage
English
Journal_Title
Computers, IEEE Transactions on
Publisher
ieee
ISSN
0018-9340
Type
jour
DOI
10.1109/T-C.1975.224264
Filename
1672857
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