DocumentCode :
1118379
Title :
Nanodielectrics for Cryogenic Applications
Author :
Tuncer, Enis ; Sauers, Isidor ; James, D. Randy ; Ellis, Alvin R. ; Pace, Marshall ; More, Karren L. ; Sathyamurthy, Srivatsan ; Woodward, Jonathan ; Rondinone, Adam J.
Author_Institution :
Oak Ridge Nat. Lab., Oak Ridge, TN, USA
Volume :
19
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
2354
Lastpage :
2358
Abstract :
In this paper we report the recent advances in nanodielectrics that were developed and tested for cryogenic dielectric applications. The systems studied are composed of nanometer size particles. Particles were produced using either an ex-situ or in-situ technique. It is observed that there are clear differences in the structural properties of materials produced using these two approaches. Either no significant degradation or improvement in the electrical insulation properties were observed for ex-situ nano-particle samples processed with an ultrasonic processor and in-situ nano-particle samples. Nanodielectrics have the potential to be tailored with better thermal and mechanical properties without losing their electrical insulation characteristics.
Keywords :
dielectric materials; electric breakdown; nanocomposites; nanofabrication; nanoparticles; cryogenic dielectric applications; dielectric breakdown strength; electrical insulation properties; ex-situ technique; in-situ technique; mechanical properties; nanocomposite; nanodielectrics; nanometer size particles; structural properties; thermal properties; ultrasonic processor; Cryogenic dielectrics; nanodielectrics; structural characterization;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2009.2018198
Filename :
5129256
Link To Document :
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