Nanodielectrics for Cryogenic Applications

Author

Tuncer, Enis ; Sauers, Isidor ; James, D. Randy ; Ellis, Alvin R. ; Pace, Marshall ; More, Karren L. ; Sathyamurthy, Srivatsan ; Woodward, Jonathan ; Rondinone, Adam J.

Author_Institution

Oak Ridge Nat. Lab., Oak Ridge, TN, USA

Volume

19

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

2354

Lastpage

2358

Abstract

In this paper we report the recent advances in nanodielectrics that were developed and tested for cryogenic dielectric applications. The systems studied are composed of nanometer size particles. Particles were produced using either an ex-situ or in-situ technique. It is observed that there are clear differences in the structural properties of materials produced using these two approaches. Either no significant degradation or improvement in the electrical insulation properties were observed for ex-situ nano-particle samples processed with an ultrasonic processor and in-situ nano-particle samples. Nanodielectrics have the potential to be tailored with better thermal and mechanical properties without losing their electrical insulation characteristics.

Keywords

dielectric materials; electric breakdown; nanocomposites; nanofabrication; nanoparticles; cryogenic dielectric applications; dielectric breakdown strength; electrical insulation properties; ex-situ technique; in-situ technique; mechanical properties; nanocomposite; nanodielectrics; nanometer size particles; structural properties; thermal properties; ultrasonic processor; Cryogenic dielectrics; nanodielectrics; structural characterization;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2009.2018198

Filename

5129256