Title :
IIB-3 analysis of the unique characteristics of the hybrid LIGT/DMOST (HIGT)
Author :
Fossum, Jerry G. ; McDonald, R.J.
fDate :
11/1/1987 12:00:00 AM
Keywords :
Anodes; Bipolar transistors; Conductivity; Current measurement; Electron devices; Insulation; Power integrated circuits; Size measurement; Testing; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23254
