Title :
IIB-8 electrical measurements of devices fabricated in pulsed arc lamp rapid-zone-recrystallized silicon on insulator
Author :
Hunt, Charles E.
fDate :
11/1/1987 12:00:00 AM
Keywords :
CMOS technology; Electric variables measurement; High speed optical techniques; Indium phosphide; Optical films; Optical modulation; Pulse measurements; Quantum well devices; Silicon on insulator technology; Strips;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23261
