Title :
A space-mapped model of thick, tightly coupled conductors for planar electromagnetic analysis
Author :
Rautio, James C.
Author_Institution :
Sonnet Software, Inc., North Syracuse, NY, USA
Abstract :
Accurate modelling of thick metal in a planar electromagnetic analysis can require that the thickness of the metal be divided into a large number of thin sheets or layers, substantially increasing analysis time. This order of modelling is especially important when two thick conductors are separated by less than the metal thickness. This article describes a method to efficiently realize the accuracy of a large number of thin sheets by introducing a "space mapping" layer into a simple model that can be efficiently analyzed.
Keywords :
conductors (electric); coplanar waveguides; planar waveguides; waveguide theory; CPW; coplanar waveguide; metal thickness; planar electromagnetic analysis; space-mapped model; thick conductors; tightly coupled conductors; Capacitance; Conductors; Coplanar waveguides; Coupled mode analysis; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic modeling; Inductance; Passivation; Permittivity;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMW.2004.1337769