• DocumentCode
    1118764
  • Title

    Authors´ Reply2

  • Author

    Pradhan, D.K. ; Reddy, S.M.

  • Issue
    7
  • fYear
    1975
  • fDate
    7/1/1975 12:00:00 AM
  • Firstpage
    758
  • Lastpage
    759
  • Abstract
    Sawin and Maki make the three following observations.
  • Keywords
    Circuit faults; Design methodology; Equations; Fault detection; Fault tolerance; Hardware; Logic design; Sequential circuits; Synchronous machines; Testing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/T-C.1975.224300
  • Filename
    1672893
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1118764