Title :
IVB-1 a true 5-V EEPROM cell for high-density NVSM
Author :
Libsch, Frank R. ; Roy, Anirban ; White, Marvin H.
fDate :
11/1/1987 12:00:00 AM
Keywords :
CMOS technology; Circuits; Dielectrics; EPROM; Electron devices; Nonvolatile memory; SONOS devices; Silicon compounds; Thermal conductivity; Ultra large scale integration;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23284
