Title :
VA-7 ionizing radiation response of GaAs heterostructure technologies
Author :
Vold, P.J. ; Arch, D.K.
fDate :
11/1/1987 12:00:00 AM
Keywords :
Circuit noise; Circuit testing; Data communication; FETs; Gallium arsenide; HEMTs; Inverters; Ionizing radiation; MODFET circuits; Military satellites;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23297
