DocumentCode :
1119217
Title :
A new quantum flux parametron logic gate with large input margin
Author :
Hioe, Willy ; Hosoya, Mutsumi ; Goto, Eiichi
Author_Institution :
Research Dev. Corp. of Japan, Tokyo, Japan
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
2765
Lastpage :
2768
Abstract :
The quantum flux parametron (QFP) is a flux-transfer, flux-activated Josephson logic device which realizes much lower power dissipation than other Josephson logic devices. Being a two-terminal device, its correct operation may be affected by coupling to other QFPs. The problems include backcoupling form active QFPs through inactive QFPs (relay noise), coupling between QFPs activated at different times because of clock skew (homophase noise), and interaction between active QFPs (reaction hazard). Previous QFP circuits worked by wired-majority, which is a linear input logic and has low input margin. A logic gate (D-gate) using a QFP to perform logic operations has been analyzed and tested by computer simulation. Relay noise, homophase noise, and reaction hazard are substantially reduced. Moreover, the inputs have little interaction, and hence input margin is greatly improved. Using only D-gates it is possible to realize any combinational logic function. Important logic functions can be realized using one gate, such as a two-input multiplexer, majority, and parity. Since the QFP has a latching effect, D-gates can realize fully pipelined circuits without additional registers
Keywords :
superconducting logic circuits; D-gate; QFP; backcoupling; clock skew; combinational logic function; computer simulation; coupling between QFPs; flux transfer device; flux-activated Josephson logic device; homophase noise; interaction between active QFPs; large input margin; latching effect; logic gate; operation; pipelined circuits; power dissipation; quantum flux parametron logic gate; reaction hazard; relay noise; two-input multiplexer; two-terminal device; Active noise reduction; Circuit noise; Coupling circuits; Electronics packaging; Hazards; Josephson junctions; Logic gates; Logic testing; Noise reduction; Relays;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133784
Filename :
133784
Link To Document :
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