Title :
Effect of RuO2 on the behavior of silver at thick-film terminations
Author :
Yamaguchi, Takashi ; Kageyama, Makiko
Author_Institution :
Fac. of Sci. & Technol., Keio Univ., Yokohama, Japan
fDate :
3/1/1988 12:00:00 AM
Abstract :
In an attempt to understand the silver-glass interactions at the electrode/resistor terminations in hybrid integrated circuits, the behavior of silver in binary 75PbO-25SiO2 glass containing up to 20 wt.% RuO2 particles was studied between 650 and 850°. It is shown that the dissolution of silver into glass increases with increasing amount of RuO2 particles. A different temperature dependence of dissolution was observed for RuO2-free and RuO2-doped glasses. Silver-ion-RuO 2 interactions have been proposed as a possible mechanism responsible for the increased dissolution of silver in the glass
Keywords :
glass; ruthenium compounds; silver; thick film resistors; 650 to 850 C; Ag-RuO2 interactions; PbO-SiO2 glass; PbO-SiO2-RuO2 glass; electrode resistor terminations; hybrid integrated circuits; temperature dependence of dissolution; thick-film terminations; Conductivity; Electrodes; Glass; Hybrid integrated circuits; Nonlinear optics; Powders; Resistors; Silver; Temperature dependence; Wire;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
