Josephson-Junction driven submillimeter wave microstrip resonator

Author

Bi, B. ; Wan, K. ; Zhang, W. ; Han, S. ; Lukens, J.E.

Author_Institution

Dept. of Phys., State Univ. of New York, Stony Brook, NY, USA

Volume

1

Issue

4

fYear

1991

Firstpage

145

Lastpage

149

Abstract

A microstrip resonator driven by a resistively shunted Josephson junction has been used for submillimeter-wave surface resistance measurements to about 400 GHz. A simple, analytical analysis of the resonator-induced structure in the junction´s I-V characteristic gives the resonator surface resistance in the range of 2-160 m Omega with an accuracy of better than 30%.<>

Keywords

electric resistance measurement; microwave measurement; resonators; solid-state microwave devices; strip line components; submillimetre wave devices; superconducting junction devices; surface conductivity; 2 to 160 mohm; 50 to 400 GHz; I-V characteristic; Josephson junction driven submillimeter wave resonator; analytical analysis; microstrip resonator; resistively shunted Josephson junction; resonator-induced structure; submillimeter-wave surface resistance measurements; Dielectric materials; Electrical resistance measurement; Frequency; Josephson junctions; Microstrip resonators; Resonance; Submillimeter wave devices; Surface resistance; Surface waves; Voltage-controlled oscillators;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.107398

Filename

107398