• DocumentCode
    1119880
  • Title

    A self-aligned quarter-to-half-micrometer buried-gate GaAs junction FET

  • Author

    Lo, Y.H. ; Wang, Shyh ; Miller, J. ; Mars, D. ; Wang, Shih-Yuan

  • Author_Institution
    University of California, Berkeley, CA
  • Volume
    8
  • Issue
    1
  • fYear
    1987
  • fDate
    1/1/1987 12:00:00 AM
  • Firstpage
    36
  • Lastpage
    38
  • Abstract
    We present a reliable but simple self-aligned technology to fabricate very short buried-gate (0.25-0.5 µm) GaAs JFET. The device has a buried p-n junction gate to control the channel current, but in particular, there is another Schottky contact connecting with the source to define the real channel length. The transconductance is 180 mS/mm and the gate leakage current density is only about one-hundredth of the conventional MESFET. Furthermore, there is no backgate effect regardless of how close two devices are neighbored. This technology and device structure are especially useful in GaAs integrated circuits.
  • Keywords
    FETs; Gallium arsenide; Hysteresis; Leakage current; Lithography; MESFETs; Ohmic contacts; Resists; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26542
  • Filename
    1487092