Title : 
Submicrometer GaAs MESFET with shallow channel and very high transconductance
         
        
            Author : 
Van Zeghbroeck, Bart J. ; Patrick, W. ; Meier, Heinz ; Vettiger, Peter
         
        
            Author_Institution : 
IBM Research Division, Rüschlikon, Switzerland
         
        
        
        
        
            fDate : 
3/1/1987 12:00:00 AM
         
        
        
        
            Abstract : 
A 0.5-µm GaAs MESFET with a 25-nm thin channel, 400- mS/mm maximum transconductance, and 580-mS/V.mm K value is presented. This extremely high K value was obtained using an electron-beam fabricated recessed-gate MESFET structure on a highly doped (9.1017cm-3) MBE-grown channel layer with 2600-cm2/V.s mobility. The use of thin channels and a buried p-layer also reduced the output conductance and other short-channel effects dramatically. As a result, these scaled MESFET´s are very promising for high-speed digital logic circuits.
         
        
            Keywords : 
Capacitance; Gallium arsenide; High K dielectric materials; High-K gate dielectrics; Lithography; Logic circuits; Logic devices; MESFET circuits; Threshold voltage; Transconductance;
         
        
        
            Journal_Title : 
Electron Device Letters, IEEE
         
        
        
        
        
            DOI : 
10.1109/EDL.1987.26572