• DocumentCode
    112062
  • Title

    Rapid Sintering Nanosilver Joint by Pulse Current for Power Electronics Packaging

  • Author

    Yunhui Mei ; Yunjiao Cao ; Gang Chen ; Xin Li ; Guo-Quan Lu ; Xu Chen

  • Author_Institution
    Tianjin Key Lab. of Adv. Joining Technol., Tianjin Univ., Tianjin, China
  • Volume
    13
  • Issue
    1
  • fYear
    2013
  • fDate
    Mar-13
  • Firstpage
    258
  • Lastpage
    265
  • Abstract
    Sintering of nanosilver paste has been extensively studied as a lead-free die-attach solution for bonding semiconductor chips. The bonding process typically consists of a low-temperature drying step to remove organic solvents in the paste followed by sintering at around 250°C . Normally, a soak time of several minutes at the sintering temperature is necessary to establish strong bond strength by the conventional heating method. In this paper, we tested the feasibility of applying pulses of alternating electrical current through the nanosilver bonding layer to achieve strong joints in less than a second, not minutes. Experiments were carried out by joining rectangular copper blocks that were either coated with a layer of electroplated silver or without. A layer of nanosilver paste was stencil printed on one block, dried at temperature below 100°C, before the other copper block was placed on. The bonding members were then inserted under an alternating-current spot-welding machine for rapid joining with current pulses. Die-shear test was used to quantify the joint strength. Investigated processing variables on the joint strength were current level, current-on time, nanosilver bondline thickness, predrying temperature and time, and copper surface finish. Scanning electron microscopy was used to characterize the joint microstructure. It is suggestive that the current sintering of nanosilver paste could be used for rapid joining of metal-to-metal connection, such as bonding copper bus bars onto power electronics modules.
  • Keywords
    bonding processes; copper alloys; crystal microstructure; electronics packaging; power electronics; scanning electron microscopy; silver alloys; sintering; surface finishing; welding equipment; Ag; Cu; alternating electrical current pulses; alternating-current spot-welding machine; bond strength; copper busbar bonding; copper surface finish; die-shear test; electroplated silver; heating method; joint microstructure; joint strength; lead-free die-attach solution; low-temperature drying step; nanosilver bonding layer; nanosilver bondline thickness; nanosilver paste sintering; organic solvents; power electronics modules; power electronics packaging; rapid sintering nanosilver joint; rectangular copper blocks; scanning electron microscopy; semiconductor chip bonding process; sintering temperature; Copper; Educational institutions; Joints; Materials; Power electronics; Silver; Surface cracks; Current sintering; lead-free; low-temperature sintering; nanosilver paste; rapid joining;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2012.2237552
  • Filename
    6401180