DocumentCode :
1120708
Title :
Submicrometer fully self-aligned AlGaAs/GaAs Heterojunction bipolar transistor
Author :
Hayama, Nobuyuki ; Okamoto, Akihiko ; Madihian, Mohammad ; Honjo, Kazuhiko
Author_Institution :
NEC Corporation, Kawasaki, Japan
Volume :
8
Issue :
5
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
246
Lastpage :
248
Abstract :
A novel submicrometer fully self-aligned AlGaAs/GaAs heterojunction bipolar transistor (HBT) for reducing parasitic capacitances and resistances is proposed. The fabrication process utilizes SiO2sidewalls for defining base electrode width and separating this electrode from both emitter and collector electrodes. Measured common-emitter current gain β for a fabricated HBT with 0.6 × 10-µm2emitter dimension and 0.7 × 10-µm2× 2 base dimension is 26 at 9 × 104-A/cm2collector current density.
Keywords :
Current density; Current measurement; Density measurement; Electrical resistance measurement; Electrodes; Fabrication; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Parasitic capacitance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26618
Filename :
1487168
Link To Document :
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