Title :
Excimer laser-processed oxide-passivated silicon solar cells of 19.5-percent efficiency
Author :
Wood, R.F. ; Westbrook, R.D. ; Jellison, G.E., Jr.
Author_Institution :
Oak Ridge National Laboratory, Oak Ridge, TN
fDate :
5/1/1987 12:00:00 AM
Abstract :
Single-crystal p+ -n-n+ silicon solar cells with AM1.5 efficiencies exceeding 19.5 percent have been fabricated using glow-discharge implantation and pulsed excimer laser annealing, together with techniques for reducing the recombination current. These techniques include extrinsic passivation by thermal oxide growth and fine-line photolithography for metallization in order to reduce the area of metal-silicon contact. These are the highest efficiency ion-implanted nonconcentrator cells reported to date and to our knowledge they are the highest efficiency p-on-n cells made by any technique.
Keywords :
Annealing; Laser sintering; Metallization; Optical pulses; Passivation; Photovoltaic cells; Silicon; Surface discharges; Surface emitting lasers; Temperature;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1987.26619