DocumentCode :
1120740
Title :
A high performance Josephson binary counter implemented in Nb and NbN technology
Author :
Whiteley, S.R. ; Kuo, F.
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
2887
Lastpage :
2890
Abstract :
A Josephson binary counter with nondestructive readout has been implemented and tested in both niobium and niobium nitride technology. Successful operation of the Nb version has been observed. The design incorporates an additional tapered-edge SiO2 level in the Nb processing sequence, which increases interferometer inductance, decreases capacitance, and ensures that geometric resonances are as high in frequency as possible. This level has the added advantage of providing mask compatibility with the NbN process, as this level is skipped in the NbN flow, thereby compensating in part for the larger penetration depth of NbN. The counter cell is designed to be as compact as possible to minimize stray inductance and maximize top count rate and high count rate bias margins. A novel readout SQUID coupling layout that allows low read SQUID inductance and requires no holes in the groundplane is used. Coupling to the adjacent count SQUID is provided by a common control line level metallization, which directs count SQUID flux through the read SQUID loop. Nb versions of the circuit functioned as expected, but low device yield limited the longest chain of functioning stages to five. The NbN circuits did not function due to higher than predicted inductance values
Keywords :
Josephson effect; SQUIDs; counting circuits; niobium; niobium compounds; nondestructive readout; superconducting logic circuits; Josephson binary counter; NDRO; Nb processing sequence; NbN technology; common control line level metallization; compact cell design; geometric resonances; interferometer inductance; mask compatibility; nondestructive readout; readout SQUID coupling layout; tapered edge SiO2 level; Capacitance; Counting circuits; Coupling circuits; Frequency; Inductance; Metallization; Niobium compounds; Nondestructive testing; Resonance; SQUIDs;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133812
Filename :
133812
Link To Document :
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