Title :
Curvature and Tangential Deflection of Discrete Arcs: A Theory Based on the Commutator of Scatter Matrix Pairs and Its Application to Vertex Detection in Planar Shape Data
Author :
Anderson, Ian M. ; Bezdek, James C.
Author_Institution :
Department of Mathematics, Utah State University, Logan, UT 84322.
Abstract :
This paper introduces a new theory for the tangential deflection and curvature of plane discrete curves. Our theory applies to discrete data in either rectangular boundary coordinate or chain coded formats: its rationale is drawn from the statistical and geometric properties associated with the eigenvalue-eigenvector structure of sample covariance matrices. Specifically, we prove that the nonzero entry of the commutator of a piar of scatter matrices constructed from discrete arcs is related to the angle between their eigenspaces. And further, we show that this entry is-in certain limiting cases-also proportional to the analytical curvature of the plane curve from which the discrete data are drawn. These results lend a sound theoretical basis to the notions of discrete curvature and tangential deflection; and moreover, they provide a means for computationally efficient implementation of algorithms which use these ideas in various image processing contexts. As a concrete example, we develop the commutator vertex detection (CVD) algorithm, which identifies the location of vertices in shape data based on excessive cummulative tangential deflection; and we compare its performance to several well established corner detectors that utilize the alternative strategy of finding (approximate) curvature extrema.
Keywords :
Acoustic scattering; Computer science; Concrete; Covariance matrix; Image converters; Image processing; Layout; Mathematics; Shape; Transmission line matrix methods; Chain codes; commutator; corner detection; covariance matrix; discrete curvature; polygonal approximation; scatter matrices; shape analysis; tangential deflection; vertex detection;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.1984.4767472