DocumentCode
1120876
Title
On the Electric Breakdown Behavior of Silicone Gel at Interfaces
Author
Finis, G. ; Claudi, A.
Author_Institution
Univ. Kassel, Kassel
Volume
15
Issue
2
fYear
2008
fDate
4/1/2008 12:00:00 AM
Firstpage
366
Lastpage
373
Abstract
Electrically stressed interfaces between solids are considered as weak points in the electrical insulation technology. This matter of fact is founded in the presence of microscopic cavities or areas with a low material density in the interface layer. Silicone gel, which is a soft and conformable solid with certain tackiness, offers a good adaptation to any surface and the ability to fill in voids completely. Due to these properties the silicone gel is predestinated for the use at electrically stressed interfaces. The work presented, describes the electric breakdown behavior of the material used at interfaces. The results provide practical information for the design of electrical insulation using silicone gel.
Keywords
electric breakdown; gels; mechanical contact; silicone insulation; electric breakdown; electrical insulation; electrically stressed interfaces; silicon gels; Breakdown voltage; Cable insulation; Dielectrics and electrical insulation; Electric breakdown; Joining materials; Medium voltage; Microscopy; Power cables; Silicon on insulator technology; Solids;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2008.4483454
Filename
4483454
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