Title :
Extracting double layer charge density distributions using the method of moments
Author :
Lonngren, Karl E. ; Schwartz, Peter V. ; Bai, Er Wei ; Theisen, William C. ; Merlino, Robert L. ; Carpenter, R.T.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fDate :
6/1/1994 12:00:00 AM
Abstract :
Using the method of moments, it is shown that the charge distribution can be directly extracted from a measured potential profile. The technique is described and placed on a theoretical foundation. The predicted charge distribution for a potential profile V=V0 tanh (x/L) using this technique is compared with a direct solution of Poisson´s equation. It is shown that similar results are obtained even if random noise is present in the system
Keywords :
numerical analysis; plasma diagnostic techniques; plasma sheaths; random noise; Poisson´s equation; charge distribution; double layer charge density distributions; method of moments; potential profile; random noise; Charge measurement; Current measurement; Extraterrestrial measurements; Laboratories; Moment methods; Plasma density; Plasma diagnostics; Plasma temperature; Poisson equations; Probes;
Journal_Title :
Plasma Science, IEEE Transactions on
