• DocumentCode
    1120993
  • Title

    Extracting double layer charge density distributions using the method of moments

  • Author

    Lonngren, Karl E. ; Schwartz, Peter V. ; Bai, Er Wei ; Theisen, William C. ; Merlino, Robert L. ; Carpenter, R.T.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
  • Volume
    22
  • Issue
    3
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    278
  • Lastpage
    280
  • Abstract
    Using the method of moments, it is shown that the charge distribution can be directly extracted from a measured potential profile. The technique is described and placed on a theoretical foundation. The predicted charge distribution for a potential profile V=V0 tanh (x/L) using this technique is compared with a direct solution of Poisson´s equation. It is shown that similar results are obtained even if random noise is present in the system
  • Keywords
    numerical analysis; plasma diagnostic techniques; plasma sheaths; random noise; Poisson´s equation; charge distribution; double layer charge density distributions; method of moments; potential profile; random noise; Charge measurement; Current measurement; Extraterrestrial measurements; Laboratories; Moment methods; Plasma density; Plasma diagnostics; Plasma temperature; Poisson equations; Probes;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.297880
  • Filename
    297880
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1120993