Abstract :
Reports some advances in the research of DFT, BIST, digital test methods, on-chip test and robust diagnosis of analogue and mixed-signal circuits. Analogue and mixed-signal components most widely used in SoCs are all covered, including filters, amplifiers, data converters, /spl Sigma//spl Delta/-modulators, phase-locked loops and frequency synthesisers.
Keywords :
analogue integrated circuits; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; BIST; DFT; EA-modulators; amplifiers; analogue circuits; data converters; digital test methods; filters; frequency synthesisers; mixed-signal circuits; on-chip test; phase-locked loops; systems on chip;
