Title :
Flexible embedded test solution for high-speed analogue front-end architectures
Author :
Lechner, A. ; Burbidge, M.J. ; Richardson, A.M.D.
Author_Institution :
Center for Microsystems Eng.-FAS, Lancaster Univ., UK
Abstract :
A flexible embedded test solution for high-speed analogue front-end subsystems is presented. A novel concept of a flexible test solution that addresses virtual component test requirements in particular is introduced. The integration and application of the non-invasive digital test solution is demonstrated for a representative design. Its area overhead is assessed for different depths in on-chip test evaluation.
Keywords :
analogue integrated circuits; analogue-digital conversion; built-in self test; high-speed integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; flexible embedded test solution; high-speed analogue front-end architectures; noninvasive digital test solution; on-chip test evaluation; test requirements; virtual component;
Journal_Title :
Circuits, Devices and Systems, IEE Proceedings
DOI :
10.1049/ip-cds:20040557
