• DocumentCode
    1121065
  • Title

    Wavelet neural network approach for fault diagnosis of analogue circuits

  • Author

    He, Y. ; Tan, Y. ; Sun, Y.

  • Author_Institution
    Coll. Of Electr. & Inf. Eng., Hunan Univ., Changsha, China
  • Volume
    151
  • Issue
    4
  • fYear
    2004
  • Firstpage
    379
  • Lastpage
    384
  • Abstract
    A systematic method for fault diagnosis of analogue circuits based on the combination of neural networks and wavelet transforms is presented. Using wavelet decomposition as a tool for removing noise from the sampled signals, optimal feature information is extracted by wavelet noise removal, multi-resolution decomposition, PCA (principal component analysis) and data normalisation. The features are applied to the proposed wavelet neural network and the fault patterns are classified. Diagnosis principles and procedures are described. The reliability of the method and comparison with other methods are shown by two active filter examples.
  • Keywords
    analogue circuits; fault simulation; neural nets; principal component analysis; signal denoising; wavelet transforms; active filter; analogue circuits; data normalisation; fault diagnosis; fault patterns; feature information extraction; multiresolution decomposition; noise removal; principal component analysis; wavelet decomposition; wavelet neural network; wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:20040495
  • Filename
    1338152