DocumentCode
1121065
Title
Wavelet neural network approach for fault diagnosis of analogue circuits
Author
He, Y. ; Tan, Y. ; Sun, Y.
Author_Institution
Coll. Of Electr. & Inf. Eng., Hunan Univ., Changsha, China
Volume
151
Issue
4
fYear
2004
Firstpage
379
Lastpage
384
Abstract
A systematic method for fault diagnosis of analogue circuits based on the combination of neural networks and wavelet transforms is presented. Using wavelet decomposition as a tool for removing noise from the sampled signals, optimal feature information is extracted by wavelet noise removal, multi-resolution decomposition, PCA (principal component analysis) and data normalisation. The features are applied to the proposed wavelet neural network and the fault patterns are classified. Diagnosis principles and procedures are described. The reliability of the method and comparison with other methods are shown by two active filter examples.
Keywords
analogue circuits; fault simulation; neural nets; principal component analysis; signal denoising; wavelet transforms; active filter; analogue circuits; data normalisation; fault diagnosis; fault patterns; feature information extraction; multiresolution decomposition; noise removal; principal component analysis; wavelet decomposition; wavelet neural network; wavelet transforms;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:20040495
Filename
1338152
Link To Document