DocumentCode :
1121318
Title :
Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance
Author :
Balestra, Francis ; Cristoloveanu, Sorin ; Benachir, Mohcine ; Brini, Jean ; Elewa, Tarek
Author_Institution :
Institut National Polytechnique de Grenoble, Grenoble, France
Volume :
8
Issue :
9
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
410
Lastpage :
412
Abstract :
The double-gate control of silicon-on-insulator (SOI) transistors is used to force the whole silicon film (interface layers and volume) in strong inversion. This original method of transistor operation offers excellent device performance, in particular great increases in subthreshold slope, transconductance, and drain current. A simulation program and experiments on SIMOX structures are used to study the new device.
Keywords :
Carrier confinement; Doping profiles; Electrostatics; FETs; MOSFET circuits; Region 1; Scattering; Semiconductor films; Silicon on insulator technology; Transconductance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26677
Filename :
1487227
Link To Document :
بازگشت