DocumentCode
112143
Title
Antiperovskite Manganese Nitride Standard Resistor
Author
Oe, Takehiko ; Urano, Chiharu ; Kaneko, Nobu-hisa ; Eisaki, Hiroshi ; Yoshida, Yoshiyuki ; Yamamoto, Atsuhi ; Takenaka, Koshi
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Volume
64
Issue
6
fYear
2015
fDate
Jun-15
Firstpage
1446
Lastpage
1450
Abstract
The antiperovskite manganese nitride compound Mn3Ag1-xCuxN has a broad resistivity-temperature curve around room temperature that is comparable with the Manganin alloy. This curvature and the peak temperature can be adjusted by codoping with Cu and In or Fe. The drift rate of the resistance value was strongly affected by the condition of the four-terminal contact and the shape of the sample. Samples with spot-welded contacts show lower resistance drift rates than samples with Ag-paste contacts. The four-terminal-shaped sample has a drift rate that is 80 times lower than the normal cuboid-shaped sample. We confirmed that the Mn3AgN sample has a sufficiently low-thermal electromotive force against copper that is less than a few microvolts per kelvin. We expect that this antiperovskite compound could be used as a material for precision resistors and could improve the temperature coefficient of resistors for developing metrology standards.
Keywords
copper compounds; electrical resistivity; manganese compounds; measurement standards; resistors; silver compounds; Mn3Ag1-xCuxN; antiperovskite standard resistor; precision resistor; resistance value; resistivity-temperature curve; silver paste contact; thermal electromotive force; Annealing; Educational institutions; Immune system; Resistance; Resistors; Shape; Standards; Aging rate; Mn₃Ag₁₋ₓCuₓN; Mn3Ag1???xCuxN; Seebeck coefficient; antiperovskite compound; dc resistance standard; standard resistor; temperature coefficient of resistance (TCR); thermal electromotive force (EMF) against copper; thermal electromotive force (EMF) against copper.;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2014.2381732
Filename
7000537
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