• DocumentCode
    1121430
  • Title

    High-efficiency GaInAs Microwave MISFET´s

  • Author

    Gardner, P.D. ; Bechtle, D. ; Narayan, S. Yegna ; Colvin, S.D. ; Paczkowski, J.

  • Author_Institution
    David Sarnoff Research Center, Inc., Princeton, NJ
  • Volume
    8
  • Issue
    9
  • fYear
    1987
  • fDate
    9/1/1987 12:00:00 AM
  • Firstpage
    443
  • Lastpage
    446
  • Abstract
    GaInAs metal-insulator-semiconductor FET\´s (MISFET\´s) fabricated with a self-aligned-gate process and 1-µm gate lengths gave power outputs as high as 857 (1.53), 424 (0.76), 415 (0.74), and 114 mW (0.20 W/mm) at 4, 12, 20 and 32.5 GHz, respectively. Power-added efficiencies of 64.3 and 55.0 percent were obtained at 4 and 12 GHz, respectively. At 20 GHz, a power-added efficiency of 32.5 percent was obtained. The value of f_{\\max } calculated from measured scattering parameters (S parameters) was ∼ 45 GHz. This high cutoff frequency was validated by the measured performance at 32.5 GHz. We believe this to be the best microwave performance reported for GaInAs power transistors. A self-aligned-gate process, essential for minimizing gate overlap capacitances while maintaining a full-gate structure, that offers the potential for Submicrometer gate-length device fabrication is described.
  • Keywords
    Fabrication; Gallium arsenide; Indium phosphide; MISFETs; Metal-insulator structures; Metallization; Microwave FETs; Microwave devices; Scattering parameters; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26687
  • Filename
    1487237