• DocumentCode
    1121471
  • Title

    A dielectrically isolated photodiode array by silicon-wafer direct bonding

  • Author

    Ohura, J. ; Tsukakoshi, T. ; Fukuda, Kenji ; Shimbo, M. ; Ohashi, H.

  • Author_Institution
    Toshiba Research and Development Center, Kawasaki, Japan
  • Volume
    8
  • Issue
    10
  • fYear
    1987
  • fDate
    10/1/1987 12:00:00 AM
  • Firstpage
    454
  • Lastpage
    456
  • Abstract
    A dielectrically isolated silicon photodiode array was successfully fabricated by a silicon-wafer direct-bonding method. A thermally oxidized wafer and another bare silicon wafer were placed in close contact at room temperature and bonded by heat treatment at 1100°C applied for 4 h. A series-connected 23-photodiode array, with a 1.6 × 1.6-mm chip size, produced a 13-V open-circuit voltage and a 7.7-µA short-circuit current at a 10-mA GaAlAs infrared-light-emitting diode current. Enough voltage was obtained to drive power MOSFET´s for switching applications, photocoupled solid-state relays, and other uses.
  • Keywords
    Dielectrics; Diodes; Heat treatment; Photodiodes; Relays; Silicon; Solid state circuits; Temperature; Voltage; Wafer bonding;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26692
  • Filename
    1487242