Title :
A dielectrically isolated photodiode array by silicon-wafer direct bonding
Author :
Ohura, J. ; Tsukakoshi, T. ; Fukuda, Kenji ; Shimbo, M. ; Ohashi, H.
Author_Institution :
Toshiba Research and Development Center, Kawasaki, Japan
fDate :
10/1/1987 12:00:00 AM
Abstract :
A dielectrically isolated silicon photodiode array was successfully fabricated by a silicon-wafer direct-bonding method. A thermally oxidized wafer and another bare silicon wafer were placed in close contact at room temperature and bonded by heat treatment at 1100°C applied for 4 h. A series-connected 23-photodiode array, with a 1.6 × 1.6-mm chip size, produced a 13-V open-circuit voltage and a 7.7-µA short-circuit current at a 10-mA GaAlAs infrared-light-emitting diode current. Enough voltage was obtained to drive power MOSFET´s for switching applications, photocoupled solid-state relays, and other uses.
Keywords :
Dielectrics; Diodes; Heat treatment; Photodiodes; Relays; Silicon; Solid state circuits; Temperature; Voltage; Wafer bonding;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1987.26692