Title :
Multiresolution color image segmentation
Author :
Liu, Jianqing ; Yang, Yee-Hong
Author_Institution :
Comput. Vision Lab., Saskatchewan Univ., Saskatoon, Sask., Canada
fDate :
7/1/1994 12:00:00 AM
Abstract :
Image segmentation is the process by which an original image is partitioned into some homogeneous regions. In this paper, a novel multiresolution color image segmentation (MCIS) algorithm which uses Markov random fields (MRF´s) is proposed. The proposed approach is a relaxation process that converges to the MAP (maximum a posteriori) estimate of the segmentation. The quadtree structure is used to implement the multiresolution framework, and the simulated annealing technique is employed to control the splitting and merging of nodes so as to minimize an energy function and therefore, maximize the MAP estimate. The multiresolution scheme enables the use of different dissimilarity measures at different resolution levels. Consequently, the proposed algorithm is noise resistant. Since the global clustering information of the image is required in the proposed approach, the scale space filter (SSF) is employed as the first step. The multiresolution approach is used to refine the segmentation. Experimental results of both the synthesized and real images are very encouraging. In order to evaluate experimental results of both synthesized images and real images quantitatively, a new evaluation criterion is proposed and developed
Keywords :
Markov processes; image segmentation; simulated annealing; tree data structures; Markov random fields; dissimilarity measures; evaluation criterion; global clustering information; maximum a posteriori estimate; merging; multiresolution color image segmentation; noise resistant; quadtree structure; real images; relaxation process; scale space filter; simulated annealing; splitting; synthesized images; Clustering algorithms; Color; Energy resolution; Image converters; Image resolution; Image segmentation; Markov random fields; Merging; Partitioning algorithms; Simulated annealing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on