Title :
On the location error of curved edges in low-pass filtered 2-D and 3-D images
Author :
Verbeek, Piet W. ; Van Vliet, Lucas J.
Author_Institution :
Pattern Recognition Group, Delft Univ. of Technol., Netherlands
fDate :
7/1/1994 12:00:00 AM
Abstract :
The authors study the location error of curved edges in two- and three-dimensional images after analog and digital low-pass filtering. The zero crossing of a second derivative filter is a well-known edge localization criterion. The second derivative in gradient direction (SDGD) produces a predictable bias in edge location towards the centers of curvature while the linear Laplace filter produces a shift in the opposite direction. Their sum called PLUS (PLUS=Laplace+SDGD) leads to an edge detector that finds curved edges one order more accurately than its constituents. This argument holds irrespective of the dimension. The influence of commonly used low-pass filters (such as the PSF originating from diffraction limited optics using incoherent light (2-D), the Gaussian filter with variable cutoff point (D-D), and the isotropic uniform filter (D-D)) is studied
Keywords :
edge detection; low-pass filters; 3-D images; Gaussian filter with variable cutoff point; PSF; analog low-pass filtering; centers of curvature; curved edges; diffraction limited optics; digital low-pass filtering; edge detector; edge localization criterion; edge location; incoherent light; isotropic uniform filter; linear Laplace filter; location error; low-pass filtered 2-D images; second derivative filter; second derivative in gradient direction; zero crossing; Annealing; Digital filters; Filtering; Hopfield neural networks; Image edge detection; Low pass filters; Neural networks; Object recognition; Optical filters; Pattern recognition;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on