DocumentCode :
112178
Title :
Using Crosscorrelation to Mitigate Analog/RF Impairments for Integrated Spectrum Analyzers
Author :
Oude Alink, Mark S. ; Klumperink, Eric A. M. ; Kokkeler, A.B.J. ; Zhiyu Ru ; Wei Cheng ; Nauta, Bram
Author_Institution :
Comput. Archit. for Embedded Syst. (CAES) Group, Univ. of Twente, Enschede, Netherlands
Volume :
61
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
1327
Lastpage :
1337
Abstract :
An integrated spectrum analyzer is useful for built-in self-test purposes, software-defined radios, or dynamic spectrum access in cognitive radio. The analog/RF performance is impaired by a number of factors, including thermal noise, phase noise, and nonlinearity. In this paper, we present an integrated circuit with two integrated RF-frontends, of which the outputs are crosscorrelated in digital baseband. We show by theory and measurements that the above-mentioned impairments are mitigated by this technique. The presented 65-nm CMOS prototype operates at 1.2 V, and obtains a noise floor below -169 dBm/Hz, an IIP3 of +25 dBm, and more than 20 dB of phase-noise reduction. In a special high-impedance mode, an even lower noise floor below -172 dBm/Hz is obtained.
Keywords :
CMOS integrated circuits; spectral analysers; thermal noise; CMOS prototype; analog-RF impairment; crosscorrelation; high-impedance mode; integrated spectrum analyzer; nonlinearity; phase noise reduction; size 65 nm; thermal noise; voltage 1.2 V; Attenuators; Bandwidth; Linearity; Phase noise; Receivers; Sensors; Built-in self-test (BIST); cognitive radio; crosscorrelation; dynamic spectrum access; noise reduction; spectrum analyzer (SA); spectrum sensing;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2012.2235458
Filename :
6401211
Link To Document :
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