DocumentCode :
1122177
Title :
Stochastic Relaxation, Gibbs Distributions, and the Bayesian Restoration of Images
Author :
Geman, Stuart ; Geman, Donald
Author_Institution :
Division of Applied Mathematics, Brown University, Providence, RI 02912.
Issue :
6
fYear :
1984
Firstpage :
721
Lastpage :
741
Abstract :
We make an analogy between images and statistical mechanics systems. Pixel gray levels and the presence and orientation of edges are viewed as states of atoms or molecules in a lattice-like physical system. The assignment of an energy function in the physical system determines its Gibbs distribution. Because of the Gibbs distribution, Markov random field (MRF) equivalence, this assignment also determines an MRF image model. The energy function is a more convenient and natural mechanism for embodying picture attributes than are the local characteristics of the MRF. For a range of degradation mechanisms, including blurring, nonlinear deformations, and multiplicative or additive noise, the posterior distribution is an MRF with a structure akin to the image model. By the analogy, the posterior distribution defines another (imaginary) physical system. Gradual temperature reduction in the physical system isolates low energy states (``annealing´´), or what is the same thing, the most probable states under the Gibbs distribution. The analogous operation under the posterior distribution yields the maximum a posteriori (MAP) estimate of the image given the degraded observations. The result is a highly parallel ``relaxation´´ algorithm for MAP estimation. We establish convergence properties of the algorithm and we experiment with some simple pictures, for which good restorations are obtained at low signal-to-noise ratios.
Keywords :
Additive noise; Annealing; Bayesian methods; Deformable models; Degradation; Energy states; Image restoration; Markov random fields; Stochastic processes; Temperature distribution; Annealing; Gibbs distribution; MAP estimate; Markov random field; image restoration; line process; relaxation; scene modeling; spatial degradation;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.1984.4767596
Filename :
4767596
Link To Document :
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