Microwave noise parameter measurements of a high temperature superconducting flux flows transistor

Author

Callaghan, J. M O ; Martens, J.S. ; Thompson, J.H. ; Beyer, J.B. ; Dman, J. E Nor

Author_Institution

Dept. of Electr. & Comput. Eng. Wisconsin Univ., Madison, WI, USA

Volume

27

Issue

2

fYear

1991

fDate

3/1/1991 12:00:00 AM

Firstpage

3289

Lastpage

3292

Abstract

The noise parameters of a high-temperature superconducting (HTS) flux flow transistor made of TlBaCaCuO operating at 77 K and 3-5 GHz were experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line, is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance, and are calculated by measuring source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz

Keywords

barium compounds; calcium compounds; electric noise measurement; electron device noise; flux flow; high-temperature superconductors; microwave measurement; superconducting junction devices; thallium compounds; 3 to 5 GHz; 77 K; TlBaCaCuO; flux motion; flux nucleation; high temperature superconducting flux flows transistor; magnetic control line; microwave measurement; noise figure; noise mechanism; noise parameters; sensitivity analysis; source impedance; statistical nature; weak links; High temperature superconductors; Impedance; Magnetic devices; Magnetic noise; Microwave measurements; Microwave transistors; Noise figure; Noise measurement; Superconducting device noise; Superconducting microwave devices;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.133915

Filename

133915