DocumentCode :
1122363
Title :
Dielectric and Conductor Loss Quantification for Microstrip Reflectarray: Simulations and Measurements
Author :
Rajagopalan, Harish ; Rahmat-Samii, Yahya
Author_Institution :
Univ. of California, Los Angeles
Volume :
56
Issue :
4
fYear :
2008
fDate :
4/1/2008 12:00:00 AM
Firstpage :
1192
Lastpage :
1196
Abstract :
The conductor and dielectric loss mechanisms in microstrip reflectarray are described using simulation models and waveguide measurements. The dielectric constant and loss tangent variation with frequency is obtained for a particular substrate using existing datasheets. Variable size patch reflectarray element was studied for loss characterization. The effect of these losses is characterized and the potential cause for the loss phenomenon is provided. It is observed that the dielectric loss and copper loss occur near the patch resonance due to strong electric fields in the substrate region below the patch and the large currents on the top surface of the patch, respectively.
Keywords :
electric fields; microstrip antenna arrays; permittivity; reflector antennas; conductor loss quantification; dielectric constant; dielectric loss; electric fields; loss tangent variation; microstrip reflectarray; variable size patch reflectarray; waveguide measurements; Conductors; Copper; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Frequency; Loss measurement; Microstrip; Conductor loss; dielectric loss; reflectarray;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2008.919225
Filename :
4483612
Link To Document :
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