Title : 
Three-Dimensional Shape Description Using the Symmetric Axis Transform I: Theory
         
        
            Author : 
Nackman, Lee R. ; Pizer, Stephen M.
         
        
            Author_Institution : 
Department of Computer Science, University of North Carolina, Chapel Hill, NC 27514; Computer-Aided Design and Analysis Project at the Manufacturing Research Center, IBM Thomas J. Watson Research Center, Yorktown, Heights, NY 10598.
         
        
        
        
            fDate : 
3/1/1985 12:00:00 AM
         
        
        
        
            Abstract : 
Blum´s two-dimensional shape description method based on the symmetric axis transform (SAT) is generalized to three dimensions. The method uniquely decomposes an object into a collection of sub-objects each drawn from three separate, but not completely independent, primitive sets defined in the paper: width primitives, based on radius function properties; axis primitives, based on symmetric axis curvatures; and boundary primitives, based on boundary surface curvatures. Width primitives are themselves comprised of two components: slope districts and curvature districts. Visualizing the radius function as if it were the height function of some mountainous terrain, each slope district corresponds to a mountain face together with the valley below it. Curvature districts further partition each slope district into regions that are locally convex, concave, or saddle-like. Similarly, axis (boundary) primitives are regions of the symmetric surface where the symmetric surface (boundary surfaces) are locally convex, concave, or saddle-like. Relations among the primitive sets are discussed.
         
        
            Keywords : 
Biomedical imaging; Computed tomography; Computer science; Data acquisition; Data mining; Hospitals; Humans; Shape measurement; Surface morphology; Visualization; Shape decomposition; shape description; symmetric axis transform;
         
        
        
            Journal_Title : 
Pattern Analysis and Machine Intelligence, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TPAMI.1985.4767643