Title :
Development of Testing Device for Critical Current Measurements for HTS/LTS
Author :
Wang, Qiuliang ; Dai, Yinming ; Zhao, Baozhi ; Song, Shousen ; Cao, Zhiqiang ; Chen, Shunzhong ; Zhang, Quan ; Wang, Housheng ; Cheng, Junsheng ; Lei, Yuanzhong ; Ye, Bai ; Li, Xian ; Liu, Jianhua ; Zhao, Shangwu ; Zhang, Hongjie ; Hu, Xinning ; Wang, Chu
Author_Institution :
Inst. of Electr. Eng., Chinese Acad. of Sci., Beijing, China
fDate :
6/1/2009 12:00:00 AM
Abstract :
For the goal of superconducting magnet applications in the advanced testing device for high temperature superconducting (HTS) wire and sample coils, a wide bore conduction-cooled superconducting magnet with available warm bore of phi 186 mm and center field of 5 T for the background magnetic field applications was designed and fabricated and tested. A sample cryostat with two GM cryocoolers is inserted in the background magnet. The system allows measurements to be performed in a repeatable and reliable fashion. The detailed design, fabrication and thermal analysis are presented in the paper.
Keywords :
critical currents; cryostats; electric current measurement; high-temperature superconductors; superconducting coils; superconducting magnets; thermal analysis; GM cryocoolers; HTS-LTS wire; conduction-cooled superconducting magnet; critical current measurements; cryostat; high-temperature superconducting wire; superconducting coils; superconducting magnet; thermal analysis; Conduction-cooled superconducting magnet; HTS test devices; electro-plastic model;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2009.2018415
