• DocumentCode
    112326
  • Title

    Effects of Temperature on Current Crowding of GaN-Based Light-Emitting Diodes

  • Author

    Eunjin Jung ; Seongjun Kim ; Hyunsoo Kim

  • Author_Institution
    Semicond. Phys. Res. Center, Chonbuk Nat. Univ., Jeonju, South Korea
  • Volume
    34
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    277
  • Lastpage
    279
  • Abstract
    The effects of temperature on the current crowding of GaN-based light-emitting diodes (LEDs) were investigated. At 300 K, LEDs fabricated with transparent ITO contacts on the p-layer (ITO-LEDs) showed a larger effective active area ratio (Ar) of 0.69, compared to 0.57 for LEDs fabricated with a reflective Ag contact. However, the Ar for ITO-LEDs decreased more rapidly with increasing temperature (0.28 at 440 K) than that for Ag-LEDs (0.31) due to the ITO-LEDs´ higher junction temperature associated with a larger series resistance, resulting in a consistent and rapid drop of optical output power.
  • Keywords
    gallium compounds; light emitting diodes; GaN; current crowding; large effective active area ratio; light-emitting diodes; temperature 300 K; temperature effect; transparent ITO contacts; Argon; Light emitting diodes; Proximity effects; Resistance; Temperature; Temperature dependence; Temperature measurement; Current crowding; light-emitting diode (LED);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2228841
  • Filename
    6403502