Author :
Shumate, P. ; Saito, Fuminori
Author_Institution :
JLT guest editor
fDate :
12/1/1985 12:00:00 AM
Keywords :
Bit rate; High speed optical techniques; Integrated circuit reliability; Integrated circuit technology; Laboratories; Optical receivers; Optical transmitters; Packaging; Physics; Societies;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.1985.1074352