DocumentCode
1123818
Title
On Edge Detection
Author
Torre, Vincent ; Poggio, Tomaso A.
Author_Institution
Department of Physics, University of Genoa, Genoa, Italy, 16146.
Issue
2
fYear
1986
fDate
3/1/1986 12:00:00 AM
Firstpage
147
Lastpage
163
Abstract
Edge detection is the process that attempts to characterize the intensity changes in the image in terms of the physical processes that have originated them. A critical, intermediate goal of edge detection is the detection and characterization of significant intensity changes. This paper discusses this part of the edge detection problem. To characterize the types of intensity changes derivatives of different types, and possibly different scales, are needed. Thus, we consider this part of edge detection as a problem in numerical differentiation. We show that numerical differentiation of images is an ill-posed problem in the sense of Hadamard. Differentiation needs to be regularized by a regularizing filtering operation before differentiation. This shows that this part of edge detection consists of two steps, a filtering step and a differentiation step. Following this perspective, the paper discusses in detail the following theoretical aspects of edge detection. 1) The properties of different types of filters-with minimal uncertainty, with a bandpass spectrum, and with limited support-are derived. Minimal uncertainty filters optimize a tradeoff between computational efficiency and regularizing properties. 2) Relationships among several 2-D differential operators are established. In particular, we characterize the relation between the Laplacian and the second directional derivative along the gradient. Zero crossings of the Laplacian are not the only features computed in early vision. 3) Geometrical and topological properties of the zero crossings of differential operators are studied in terms of transversality and Morse theory.
Keywords
Band pass filters; Computational efficiency; Computer vision; Filtering theory; Image edge detection; Information filtering; Laplace equations; Material properties; Sensor arrays; Uncertainty;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.1986.4767769
Filename
4767769
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