Title :
Improvement of Thermal Environment by Thermoelectric Coolers and Numerical Optimization of Thermal Performance
Author :
Ning Wang ; Xiao-Chun Li ; Jun-Fa Mao
Author_Institution :
Key Lab. of Minist. of Educ. of Design & Electromagn. Compatibility of High Speed Electron. Syst., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Seeking for an available thermal runaway solution is becoming one important and challenging issue in current nanometer ICs. Thermoelectric coolers (TECs) may give a solution. In this paper, a simplified power model of circuits closely associated with temperature with and without repeaters is derived. Based on the surface temperature difference and heat-flow density, an equivalent thermal resistance model for powered TECs is proposed. According to the thermal profile model, the steady-state temperature is calculated for the same chip with two different package forms. Finally, optimizations of p-n couples are performed with the purpose of obtaining the maximum coefficient of performance (COP) and minimum TECs power. As compared with the traditional flip-flop controlled-collapse-chip-connection package, the results reveal desirable conclusions that a 15.8% decrease of the chip stability temperature with the COP optimization at I =2.5 A and 11.4% steady-state power savings with the 13.2 W TEC power consumption are obtained in a 50-nm technology node. Analysis demonstrates that the maximum COP and minimum power consumed by TECs can be obtained at different optimum numbers of p-n couples, which is independent of electrical current across by TECs.
Keywords :
integrated circuit modelling; power consumption; repeaters; thermal resistance; thermoelectric cooling; IC; coefficient of performance; current 2.5 A; electrical current; equivalent thermal resistance model; flip-flop controlled-collapse-chip-connection package; numerical optimization; power 13.2 W; power consumption; power model; repeaters; size 50 nm; thermal environment; thermal performance; thermal runaway solution; thermoelectric coolers; Electronic packaging thermal management; Heat sinks; Repeaters; Steady-state; Thermal resistance; Controlled-collapse-chip-connection (C4); Seebeck; thermal runaway; thermal stability; thermoelectric coolers (TECs); thermoelectric coolers (TECs).;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2015.2442530