• DocumentCode
    112388
  • Title

    Improvement of Thermal Environment by Thermoelectric Coolers and Numerical Optimization of Thermal Performance

  • Author

    Ning Wang ; Xiao-Chun Li ; Jun-Fa Mao

  • Author_Institution
    Key Lab. of Minist. of Educ. of Design & Electromagn. Compatibility of High Speed Electron. Syst., Shanghai Jiao Tong Univ., Shanghai, China
  • Volume
    62
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2579
  • Lastpage
    2586
  • Abstract
    Seeking for an available thermal runaway solution is becoming one important and challenging issue in current nanometer ICs. Thermoelectric coolers (TECs) may give a solution. In this paper, a simplified power model of circuits closely associated with temperature with and without repeaters is derived. Based on the surface temperature difference and heat-flow density, an equivalent thermal resistance model for powered TECs is proposed. According to the thermal profile model, the steady-state temperature is calculated for the same chip with two different package forms. Finally, optimizations of p-n couples are performed with the purpose of obtaining the maximum coefficient of performance (COP) and minimum TECs power. As compared with the traditional flip-flop controlled-collapse-chip-connection package, the results reveal desirable conclusions that a 15.8% decrease of the chip stability temperature with the COP optimization at I =2.5 A and 11.4% steady-state power savings with the 13.2 W TEC power consumption are obtained in a 50-nm technology node. Analysis demonstrates that the maximum COP and minimum power consumed by TECs can be obtained at different optimum numbers of p-n couples, which is independent of electrical current across by TECs.
  • Keywords
    integrated circuit modelling; power consumption; repeaters; thermal resistance; thermoelectric cooling; IC; coefficient of performance; current 2.5 A; electrical current; equivalent thermal resistance model; flip-flop controlled-collapse-chip-connection package; numerical optimization; power 13.2 W; power consumption; power model; repeaters; size 50 nm; thermal environment; thermal performance; thermal runaway solution; thermoelectric coolers; Electronic packaging thermal management; Heat sinks; Repeaters; Steady-state; Thermal resistance; Controlled-collapse-chip-connection (C4); Seebeck; thermal runaway; thermal stability; thermoelectric coolers (TECs); thermoelectric coolers (TECs).;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2442530
  • Filename
    7134787