DocumentCode
112388
Title
Improvement of Thermal Environment by Thermoelectric Coolers and Numerical Optimization of Thermal Performance
Author
Ning Wang ; Xiao-Chun Li ; Jun-Fa Mao
Author_Institution
Key Lab. of Minist. of Educ. of Design & Electromagn. Compatibility of High Speed Electron. Syst., Shanghai Jiao Tong Univ., Shanghai, China
Volume
62
Issue
8
fYear
2015
fDate
Aug. 2015
Firstpage
2579
Lastpage
2586
Abstract
Seeking for an available thermal runaway solution is becoming one important and challenging issue in current nanometer ICs. Thermoelectric coolers (TECs) may give a solution. In this paper, a simplified power model of circuits closely associated with temperature with and without repeaters is derived. Based on the surface temperature difference and heat-flow density, an equivalent thermal resistance model for powered TECs is proposed. According to the thermal profile model, the steady-state temperature is calculated for the same chip with two different package forms. Finally, optimizations of p-n couples are performed with the purpose of obtaining the maximum coefficient of performance (COP) and minimum TECs power. As compared with the traditional flip-flop controlled-collapse-chip-connection package, the results reveal desirable conclusions that a 15.8% decrease of the chip stability temperature with the COP optimization at I =2.5 A and 11.4% steady-state power savings with the 13.2 W TEC power consumption are obtained in a 50-nm technology node. Analysis demonstrates that the maximum COP and minimum power consumed by TECs can be obtained at different optimum numbers of p-n couples, which is independent of electrical current across by TECs.
Keywords
integrated circuit modelling; power consumption; repeaters; thermal resistance; thermoelectric cooling; IC; coefficient of performance; current 2.5 A; electrical current; equivalent thermal resistance model; flip-flop controlled-collapse-chip-connection package; numerical optimization; power 13.2 W; power consumption; power model; repeaters; size 50 nm; thermal environment; thermal performance; thermal runaway solution; thermoelectric coolers; Electronic packaging thermal management; Heat sinks; Repeaters; Steady-state; Thermal resistance; Controlled-collapse-chip-connection (C4); Seebeck; thermal runaway; thermal stability; thermoelectric coolers (TECs); thermoelectric coolers (TECs).;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2442530
Filename
7134787
Link To Document