Title :
Loopback DFT for Low-Cost Test of Single-VCO-Based Wireless Transceivers
Author :
Srinivasan, Ganesh ; Taenzler, Friedrich ; Chatterjee, Abhijit
Author_Institution :
Texas Instrum., Dallas
Abstract :
This article discusses a loopback DFT test approach for RFIC chips that provides quick, economical test results at the wafer level. By performing RF testing before chip packaging, the authors reduce test cost. They show that test yield on the ATE for Texas Instruments´ RFIC devices is high when this loopback DFT approach is used.
Keywords :
discrete Fourier transforms; integrated circuit testing; radiofrequency integrated circuits; transceivers; voltage-controlled oscillators; wafer level packaging; ATE; RFIC chips; RFIC devices; Texas Instruments; chip packaging; loopback DFT; low-cost testing; single-VCO; wireless transceivers; Bluetooth; Costs; Instruments; Packaging; Probes; Radio frequency; Semiconductor device manufacture; Testing; Transceivers; Voltage-controlled oscillators; DFT; RF test; loopback test; low-cost test; test yield; wafer probe test;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.46
