Title :
Code-pattern insensitive embedded ROMs using dynamic bitline shielding technique
Author :
Chang, M.-F. ; Wen, K.A. ; Chiou, L.Y.
Author_Institution :
Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fDate :
7/21/2005 12:00:00 AM
Abstract :
A dynamic bitline shielding (DBS) technique is proposed for high-speed via-programming ROMs, to eliminate code-pattern-dependent crosstalk-induced read failure (CIRF) and increase code-pattern coverage. Fabricated 256 Kb conventional and DBS ROMs demonstrated that the DBS technique can eliminate the CIRF and operate with a small sensing margin.
Keywords :
crosstalk; embedded systems; read-only storage; shielding; 256 kbyte; code pattern insensitive; crosstalk induced read failure; dynamic bitline shielding; embedded ROM; high speed via programming; sensing margin;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20051738
