• DocumentCode
    1123992
  • Title

    Simulation by Finite Difference Numerical Method of {\\rm Nb}_{3}{\\rm Sn} Strand Under Bending Strain

  • Author

    Zignani, Chiarasole Fiamozzi ; Corato, Valentina ; Della Corte, Antonio ; Zenobio, Aldo Di ; Messina, Giuseppe ; Muzzi, Luigi

  • Author_Institution
    ENEA, Frascati, Italy
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    2641
  • Lastpage
    2644
  • Abstract
    We report on the simulation of the current distribution in Nb3Sn strand subjected to pure bending strain, obtained by resolving the implicit diffusion equations with finite difference algorithm in Mathworks environment. The critical current dependence on bending, temperature, and magnetic field is modeled by the Improved Deviatoric Scaling Law and is used in the power law electric field dependence across the superconductor. The strand is discretized in elements representing groups of twisted filaments embedded in the stabilization matrix and a distributed constant circuit model is applied for current transfer among filament bundles. The code is preliminarily validated by comparison with analytical solutions for different simplified situations, each one corresponding to a proper boundary condition. Transverse matrix resistivity and twist-pitch values are crucial elements for matching numerical results with experimentally measured critical currents.
  • Keywords
    bending; electrical resistivity; finite difference methods; nickel alloys; niobium alloys; superconducting materials; Mathworks environment; Nb3Sn; bending strain; critical current dependence; distributed constant circuit model; filament bundles; finite difference numerical method; implicit diffusion equations; magnetic field; power law electric field dependence; transverse matrix resistivity; twisted filaments; ${rm Nb}_{3}{rm Sn}$; Bending strain; critical current; current distribution; numerical simulation;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2019098
  • Filename
    5153218