DocumentCode :
1124359
Title :
Evaluation and analytical electron microscopy investigation of a plated aluminum wire for branch circuit applications
Author :
Aronstein, Jesse ; Hare, Thomas K.
Volume :
11
Issue :
2
fYear :
1988
fDate :
6/1/1988 12:00:00 AM
Firstpage :
218
Lastpage :
226
Abstract :
Using two-wire splices made with twist-on connectors, the connection performance of a plated aluminum wire has been evaluated over five years of operation at low duty-cycle within rated electrical and environmental conditions. Analytical electron microscopy techniques were used to physically and chemically characterize the surface of the connection test wire, a sample exposed in a controlled environmental test chamber, and a freshly stripped sample of the same wire. The test results show that the plated aluminum wire has improved connectability relative to unplated aluminum previously tested, but it is not equivalent to copper wire. Safe long-term performance of plated aluminum wire is not likely to be achieved without improvement in the integrity of the plating and/or the use of corrosion inhibitor
Keywords :
aluminium; electric connectors; electron microscopy; environmental testing; Al wire; analytical electron microscopy; branch circuit applications; connectability; connection performance; controlled environmental test chamber; corrosion inhibitor; environmental conditions; long-term performance; low duty-cycle; twist-on connectors; two-wire splices; Aluminum alloys; Cable insulation; Chemical analysis; Circuits; Copper; Corrosion; Electron microscopy; Nickel; Testing; Wire;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.2990
Filename :
2990
Link To Document :
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