Title :
Full-wave analysis of microwave scattering from short vegetation: an investigation on the effect of multiple scattering
Author :
Oh, Yisok ; Jang, Young-Mi ; Sarabandi, Kamal
Author_Institution :
Dept. of Radio Sci. & Commun. Eng., Hong-ik Univ., Seoul, South Korea
fDate :
11/1/2002 12:00:00 AM
Abstract :
A full-wave solution for polarimetric scattering from a cluster of randomly oriented three-dimensional lossy dielectric structures above an impedance surface is presented to investigate the importance of multiple scattering. The problem is formulated using an integral equation in conjunction with the exact image representation of dyadic Green´s function for the half-space problem. Then, the integral equation is solved for the induced equivalent polarization currents using the method of moments. The accuracy of the numerical code is verified using other existing numerical results and experimental observations. The model is then used to examine the effect of multiple scattering among a cluster of relatively short stems and is shown that multiple scattering significantly affects the cross-polarized backscatter whereas it has a moderate effect on the copolarized backscattering depending on the stem density.
Keywords :
backscatter; geophysical techniques; radar cross-sections; radar theory; remote sensing by radar; terrain mapping; vegetation mapping; backscatter; dyadic Green´s function; full wave analysis; geophysical measurement technique; half-space; impedance surface; integral equation; land surface; method of moments; microwave scattering; multiple scattering; polarimetric scattering; radar polarimetry; radar remote sensing; radar scattering; randomly oriented structures; short vegetation; terrain mapping; three-dimensional lossy dielectric structures; vegetated surface; vegetation mapping; Backscatter; Dielectric losses; Green´s function methods; Image representation; Integral equations; Moment methods; Polarization; Scattering; Surface impedance; Vegetation mapping;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on
DOI :
10.1109/TGRS.2002.805085