Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs

This paper presents a deterministic dynamic element matching (DDEM) approach, which is applied to low-precision digital-to-analog converters (DACs) to generate uniformly spaced voltage samples for analog-to-digital converter (ADC) testing. Theoretical analysis is provided to show the test performance using this DDEM DAC. Both simulation results and experimental results from a fabricated DDEM DAC are presented to verify the performance. The ADC testing performance, by using an 8-bit DDEM DAC (linearity less than 5 bits without DDEM), is comparable to the best results reported in the literature using on-chip linear ramp generators. The DDEM technique offers great potential for use in both production test and built-in-self-test (BIST) environments.