Title :
Local Oscillations of On-Die Supply Voltage—A Reliability Issue
Author :
Gurfinkel, Moshe ; Livshits, Pavel ; Rozen, Anton ; Fefer, Yefim ; Bernstein, Joseph B. ; Shapira, Yoram
Author_Institution :
Sch. of Electr. Eng., Tel Aviv Univ., Tel Aviv, Israel
Abstract :
On-die measurements of V DD and V SS voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the V DD and V SS voltages with amplitudes that can reach, in severe cases, more than 10% of V DD. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.
Keywords :
VLSI; integrated circuit measurement; integrated circuit reliability; nanoelectronics; VDD measurement; VSS measurements; VLSI technology chip; analog signal distortion; local oscillations; logic faults; on-die supply voltage; reliability wear-out mechanism; Power-distribution network; reliability; supply-noise measurement;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2009.2025955
