• DocumentCode
    1125072
  • Title

    Local Oscillations of On-Die Supply Voltage—A Reliability Issue

  • Author

    Gurfinkel, Moshe ; Livshits, Pavel ; Rozen, Anton ; Fefer, Yefim ; Bernstein, Joseph B. ; Shapira, Yoram

  • Author_Institution
    Sch. of Electr. Eng., Tel Aviv Univ., Tel Aviv, Israel
  • Volume
    9
  • Issue
    3
  • fYear
    2009
  • Firstpage
    476
  • Lastpage
    482
  • Abstract
    On-die measurements of V DD and V SS voltages inside a 90-nm VLSI technology chip are presented. The results show local fluctuations in the V DD and V SS voltages with amplitudes that can reach, in severe cases, more than 10% of V DD. These fluctuations can distort analog signals, cause immediate logic faults, and also aggravate other reliability wear-out mechanisms. Both measurements and simulations predict the aggravation of this phenomenon for future technologies.
  • Keywords
    VLSI; integrated circuit measurement; integrated circuit reliability; nanoelectronics; VDD measurement; VSS measurements; VLSI technology chip; analog signal distortion; local oscillations; logic faults; on-die supply voltage; reliability wear-out mechanism; Power-distribution network; reliability; supply-noise measurement;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2009.2025955
  • Filename
    5153317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1125072