• DocumentCode
    1125144
  • Title

    Finite-Difference Frequency-Domain Analysis of 2-D Photonic Crystals With Curved Dielectric Interfaces

  • Author

    Chiang, Yen-Chung ; Chiou, Yih-Peng ; Chang, Hung-chun

  • Author_Institution
    Nat. Chung-Hsing Univ., Taichung
  • Volume
    26
  • Issue
    8
  • fYear
    2008
  • fDate
    4/15/2008 12:00:00 AM
  • Firstpage
    971
  • Lastpage
    976
  • Abstract
    An improved finite-difference frequency-domain method based on Taylor series expansion, local coordinate transformation, and boundary condition matching is developed for analyzing the band diagrams of 2-D photonic crystals. This newly proposed scheme can deal with piecewise homogeneous structures with curved dielectric interfaces. It also shows much better performance in modeling structures of highly index contrast ratio. We have verified this improved scheme with frequently-used plane-wave expansion method through the calculation of the band diagrams of a 2-D photonic crystal with square lattice. We also compare the scheme with the staircase approximation. We further improve the convergence behavior by adopting high-order terms. The result of this adopting is also demonstrated.
  • Keywords
    dielectric materials; finite difference methods; frequency-domain analysis; photonic crystals; 2D photonic crystals; Taylor series expansion; band diagrams; boundary condition matching; curved dielectric interfaces; finite-difference frequency-domain analysis; local coordinate transformation; piecewise homogeneous structures; plane-wave expansion method; staircase approximation; Boundary conditions; Convergence; Crystalline materials; Dielectrics; Finite difference methods; Frequency domain analysis; Optical propagation; Photonic crystals; Semiconductor materials; Time domain analysis; Electromagnetic propagation; finite-difference methods; frequency-domain analysis; photonic crystals; step-index waveguides;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2007.916499
  • Filename
    4484146