• DocumentCode
    1125196
  • Title

    Analysis of GaInP/AlGaInP compressive strained multiple-quantum-well laser

  • Author

    Kamiyama, Satoshi ; Uenoyama, Takeshi ; Mannoh, Masaya ; Ban, Yuzaburoh ; Ohnaka, Kiyoshi

  • Author_Institution
    Central Res. Labs., Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    6/1/1994 12:00:00 AM
  • Firstpage
    1363
  • Lastpage
    1369
  • Abstract
    We have analyzed GaInP/AlGaInP compressive strained MQW lasers, with theoretical calculation and experimental results. Our calculations of TE polarized gain, where the valence subband mixing and the heterobarrier leakage current are taken into account, are in good agreement with the experimental results. When a compressive strain of up to 0.5% is induced in the quantum wells, the density of states near the valence band edge is decreased, due to the reduction of heavy-hole and light-hole subband mixing. At the threshold condition, the compressive strain reduces not only the radiative recombination current, but also the hetero-barrier leakage current. Therefore, the threshold current is reduced, and its temperature dependence is found to be small, In the analysis, we also show that when larger compressive strain of more than 0.5% is induced in the 40-Å-thick quantum wells, the threshold characteristics are degraded
  • Keywords
    III-V semiconductors; aluminium compounds; band structure of crystalline semiconductors and insulators; gallium compounds; indium compounds; internal stresses; semiconductor lasers; valence bands; GaInP-AlGaInP; GaInP/AlGaInP compressive strained multiple-quantum-well laser; compressive strain; experimental results; heavy-hole subband mixing; heterobarrier leakage current; light-hole subband mixing; radiative recombination current; temperature dependence; theoretical calculation; threshold condition; threshold current; transverse electric polarized gain; valence band edge; valence subband mixing; Capacitive sensors; Laser theory; Leakage current; Polarization; Quantum well devices; Quantum well lasers; Radiative recombination; Tellurium; Temperature dependence; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.299458
  • Filename
    299458