Title :
Improvement of aging simulation of electronic circuits using behavioral modeling
Author :
Marc, Francois ; Mongellaz, Benoit ; Bestory, Corinne ; Levi, Hervw ; Danto, Yves
Author_Institution :
Lab. IXL, Univ. Bordeaux, Talence
fDate :
6/1/2006 12:00:00 AM
Abstract :
This paper presents an original method of analog circuits aging simulation. This method is based on a behavioral modelling of circuits that includes the effects of degradations on circuit parameters, on the basis of transistors aging. The efficiency of the method is demonstrated in the case of hot carriers degradation in an amplifier
Keywords :
ageing; analogue integrated circuits; circuit simulation; hot carriers; integrated circuit modelling; integrated circuit reliability; amplifier; analog circuits aging simulation; behavioral modeling; behavioral modelling; circuit parameters; electronic circuits; hot carriers degradation; integrated circuit reliability; transistor aging; Aging; Analog circuits; Circuit simulation; Computational modeling; Degradation; Electronic circuits; Hot carriers; MOSFETs; Stress; Voltage; Electronics; hot carriers; reliability modelling;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2006.879117
