• DocumentCode
    1125456
  • Title

    Structure-dependent threshold current density for CdZnSe-based II-VI semiconductor lasers

  • Author

    Wu, Yi-Hong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
  • Volume
    30
  • Issue
    7
  • fYear
    1994
  • fDate
    7/1/1994 12:00:00 AM
  • Firstpage
    1562
  • Lastpage
    1573
  • Abstract
    The optical gain and threshold current density of CdZnSe-based semiconductor lasers are calculated theoretically with strain and quantum confinement effects taken into account. Both diffusion and drift components are incorporated into the calculation of leakage current. Optimized structures are obtained for CdZnSe-based lasers with different structures through minimizing the threshold current density. A minimum current density of about 200 A/cm2 is obtained for a Cd0.2Zn0.8Se/ZnS0.06Se0.94 /Zn0.75Mg0.25S0.42Se0.58 modified MQW laser
  • Keywords
    II-VI semiconductors; cadmium compounds; laser theory; leakage currents; semiconductor lasers; zinc compounds; Cd0.2Zn0.8Se-ZnS0.06Se0.94 -Zn0.75Mg0.25S0.42Se0.58 ; CdZnSe-based II-VI semiconductor lasers; MQW laser; diffusion current; drift current; leakage current; optical gain; optimized structures; quantum confinement; strain; threshold current density; Diode lasers; Effective mass; Holographic optical components; Holography; Laser theory; Optical pumping; Quantum well devices; Quantum well lasers; Semiconductor lasers; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.299488
  • Filename
    299488