DocumentCode
1125456
Title
Structure-dependent threshold current density for CdZnSe-based II-VI semiconductor lasers
Author
Wu, Yi-Hong
Author_Institution
Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore
Volume
30
Issue
7
fYear
1994
fDate
7/1/1994 12:00:00 AM
Firstpage
1562
Lastpage
1573
Abstract
The optical gain and threshold current density of CdZnSe-based semiconductor lasers are calculated theoretically with strain and quantum confinement effects taken into account. Both diffusion and drift components are incorporated into the calculation of leakage current. Optimized structures are obtained for CdZnSe-based lasers with different structures through minimizing the threshold current density. A minimum current density of about 200 A/cm2 is obtained for a Cd0.2Zn0.8Se/ZnS0.06Se0.94 /Zn0.75Mg0.25S0.42Se0.58 modified MQW laser
Keywords
II-VI semiconductors; cadmium compounds; laser theory; leakage currents; semiconductor lasers; zinc compounds; Cd0.2Zn0.8Se-ZnS0.06Se0.94 -Zn0.75Mg0.25S0.42Se0.58 ; CdZnSe-based II-VI semiconductor lasers; MQW laser; diffusion current; drift current; leakage current; optical gain; optimized structures; quantum confinement; strain; threshold current density; Diode lasers; Effective mass; Holographic optical components; Holography; Laser theory; Optical pumping; Quantum well devices; Quantum well lasers; Semiconductor lasers; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.299488
Filename
299488
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